The hottest 2011 National Conference on materials

2022-08-06
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2011 National Conference on materials science and electron microscopy and solicitation of papers (first round notice)

I. notice of 2011 National Conference on materials science and electron microscopy

with the rapid development of electron microscopy, the electron microscopic characterization technology of materials is changing with each passing day. The high spatial resolution analytical TEM with field emission gun enables people to analyze the morphology, structure and composition of nano scale regions by using high-resolution technology, micro diffraction, electron energy spectrum and electron energy loss spectrum. The spherical aberration correction TEM improved the point resolution to 0.08nm. The environmental scanning electron microscope can be used to observe the changes of samples by heating, cooling, adding gas and liquid under low vacuum. SEM equipped with EBSD attachment can easily give the information of grain size, grain orientation, texture and so on. With the advent of STM, we can observe the lattice structure of atoms in real space. AFM can characterize the three-dimensional morphology of the sample with a resolution of 0.1nm in the horizontal direction and 0.01nm in the vertical direction by detecting the interaction between the probe and the sample. With advanced instruments and equipment and strong support from the top for scientific research, the research work in the field of electronic microscopy in China has begun to step into the forefront of relevant disciplines in the world

with the demand of in-situ observation and material property testing, the emergence and application of various electron microscope sample tables have led to the arrival of a new round of material electron microscopy research climax in China. In particular, the in-situ measurement of the structure, electrical, magnetic and mechanical properties of nano materials has obtained a series of new research results, providing theoretical and experimental basis for the development and application of new materials. What is more gratifying is that the electron microscope sample table with specific functions is no longer completely dependent on foreign manufacturers. Some units and researchers began to design and manufacture by themselves. Some of them have been successfully used in material research and formed patented products. Under this situation, it is timely and necessary to hold a national conference on materials electron microscopy to display and exchange the latest scientific research achievements and promote the development and progress of Materials Science in China

therefore, the society decided to hold a National Symposium on electronic microscopy of Materials Science in the summer and autumn of 2011. The conference will specially invite international and domestic famous scholars in the fields of microscopy and related sciences to make special reports, so that the vast number of electron microscope workers and young students in related fields in China can have the opportunity to communicate directly with these famous scholars

manufacturers of relevant instruments and equipment will be invited to introduce the latest development of electron microscope and other instruments and display their products. The academic exchange contents of the conference include the basic and applied research achievements of transmission electron microscope, scanning electron microscope, microbeam analysis, scanning probe microscope (including STM, AFM, etc.), laser confocal microscope, etc. in the fields of material science, nanotechnology, chemical engineering, environmental science, geoscience, etc; The development and improvement of the theory, technology and experimental methods of microscopy related instruments; The use, improvement and maintenance experience exchange of electron microscope and other microscopy instruments. The conference will set up two sub venues, namely, the application of SEM in the field of material science and the application of TEM in the field of material science

II. Essay solicitation

1 Content:

(1) applications of transmission electron microscope, scanning electron microscope, microbeam analyzer, scanning probe microscope (including scanning tunneling microscope, atomic force microscope, etc.), laser confocal microscope, etc. in research fields and production of materials science, chemical engineering, geoscience, environmental science, etc

(2) theoretical research, new product development, performance improvement, software development, etc. related to electronic microscope, microbeam analyzer, scanning probe microscope (including scanning tunneling microscope, atomic force microscope, etc.), laser confocal microscope and other instruments and equipment

(3) theoretical research on image processing of microscopy, research and development of instruments, equipment and software

(4) firstly, we should take the resource-saving development path to develop and improve the instruments, sample preparation methods and technologies for micro sample preparation

(5) experience in the management, use and maintenance of microscopy instruments

the meeting will be held in the form of conference invitation report, sub conference report, special discussion, paper presentation, etc

2. The genre, format and layout requirements of the thesis

(1) the candidate thesis should have prominent theme, reliable data, rigorous demonstration, clear image and concise sentences. It is required to provide a detailed abstract of the paper (2 pages), and a full text of the paper (the original is required to have not been published in other journals). At the same time, the contributions shall be sent to the Department by e-mail (e-mail:dzxwxb@; CC: dzxwxb@) (for the format, see the draft rules of Journal of electron microscopy, please log in the journal page to view:; or the society station:). The abstract of the paper is for the collection of conference papers (abstracts). The full paper will be published in Journal of electron microscopy

(2) requirements for papers:

the abstract draft of the selected papers will be compiled into the proceedings of the 2011 National Conference on electronic microscopy of materials science, which will be printed and published separately, and will no longer belong to the Journal of electronic microscopy. The collection of theses is a large 16 folio, and all the contents of the manuscript are arranged in 170mm × Within 240mm, each paper abstract can occupy 2 pages. The attached pictures shall be neatly cut with A4 white paper and arranged in a standard manner. Chinese phonetic alphabet with English title, author's unit and author's name. The anthology will be published before the meeting. (refer to the layout format of the abstracts of the papers published at the previous national electron microscopy conferences)

the full text of the selected papers will be published in the Journal of electron microscopy in 2011. Detailed English abstract is required

(3) the contributions are reviewed by experts organized by the academic committee and selected according to the article level and picture quality. Contributions, whether selected or not, will not be returned

(4) the deadline for soliciting papers is april30,2011, subject to the postmark. Please indicate the name, address, postal code, (inclusive) and e-mail address of the contact person. The manuscript of the paper should be sent to "No. 13, beiertao, Zhongguancun, Beijing, the Secretariat of the 2011 National Conference on materials science and electron microscopy of the Chinese society of electron microscopy, zip code 100190". Late will not be accepted

contact: (Department Li Ningchun); E-mail:dzxwxb@; Dzxwxb@

(Essay)

in fact, waste materials are recycled and processed into 3D printing materials (Hu Ping of the Secretariat) e-mail:cemshp@ (specific affairs of the meeting)

China Electronics Society for looking for other materials to manufacture plastic sub microscopes

Secretariat of "2011 National Conference on electronic microscopy of materials science

December 30, 2010

note: the source of this reprint is indicated, and the reprint is for the purpose of transmitting more information, It does not mean that the entry threshold for agreeing with their views or confirming the authenticity of their contents is low

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